A New Test Compression Scheme
نویسندگان
چکیده
Generalized Modified Positional Syndrome (GMPS), of order p, a new compaction scheme for test output data is presented. The order p determines the alising probability and the amount of hardware overhead required to implement the scheme. GMPS of order two gives an aliasing probability about an order of magnitude lower than the best scheme reported in literature with minimal extra hardware. A hardware realization scheme for GMPS has been presented. The scheme uses adders with feedback.
منابع مشابه
Alternating Frequency-Directed Equal-Run-Length Coding
This chapter presents a new encoding scheme called alternating frequency-directed equal-run-length (AFDER) coding for test data compression. This encoding scheme together with nine-coded compression technique enhance the test data compression ratio. In the first stage, the pre-generated test cubes with unspecified bits are encoded using nine-coded compression scheme. Later, the proposed encodin...
متن کاملفشردهسازی تصویر با کمک حذف و کدگذاری هوشمندانه اطلاعات تصویر و بازسازی آن با استفاده از الگوریتم های ترمیم تصویر
Compression can be done by lossy or lossless methods. The lossy methods have been used more widely than the lossless compression. Although, many methods for image compression have been proposed yet, the methods using intelligent skipping proper to the visual models has not been considered in the literature. Image inpainting refers to the application of sophisticated algorithms to replace lost o...
متن کاملA New LFSR Reseeding based Test Compression Scheme by Virtual Reduction of Smax
A new LFSR based test compression scheme is proposed by reducing the maximum number of specified bits in the test cube set, smax, virtually. The performance of a conventional LFSR reseeding scheme highly depends on smax. In this paper, by using different clock phases between an LFSR and scan chains, and grouping the scan cells, we could reduce smax virtually. If the clock frequency which is slo...
متن کاملA New Test Data Compression for Low Power Test
This paper proposes a new test data compression method for low power testing. To improve compression ratio, the proposed scheme uses the modified input reduction and novel techniques, a new scan flip-flop reordering algorithm and a newly proposed one block compression. The proposed method leads to better compression ratio with lower hardware overhead and lower power consumption than previous wo...
متن کاملA New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment
A new scan architecture for both low power testing and test volume compression is proposed. For low power test requirements, only a subset of scan cells is loaded with test stimulus and captured with test responses by freezing the remaining scan cells according to the distribution of unspecified bits in the test cubes. In order to optimize the proposed process, a novel graph-based heuristic is ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
دوره شماره
صفحات -
تاریخ انتشار 1999